Category:OSW8d1fa6af1c4055668605b90153636112: Difference between revisions

VisualWikitext

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      ],
      "uuid": "8d1fa6af-1c40-5566-8605-b90153636112",
-     "iri": "chameo:SecondaryIonMassSpectrometry",
+     "iri": "https://w3id.org/emmo/domain/characterisation-methodology/chameo#SecondaryIonMassSpectrometry",
      "name": "SecondaryIonMassSpectrometry",
      "label": [
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      ],
      "meta": {
-         "uuid": "b746e2b1-bf24-45a2-a0a6-083cf987ea41",
+         "uuid": "a01f538b-3cdf-4e4f-aee9-72168f143e1f",
          "wiki_page": {
              "title": "OSW8d1fa6af1c4055668605b90153636112",

Revision as of 21:39, 26 February 2025

SecondaryIonMassSpectrometry
ID	OSW8d1fa6af1c4055668605b90153636112
UUID	8d1fa6af-1c40-5566-8605-b90153636112
Label	SecondaryIonMassSpectrometry
Machine compatible name	SecondaryIonMassSpectrometry
Statements (outgoing)

Statements (incoming)

Description

Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions.

Category (Class)

OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SecondaryIonMassSpectrometry

EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass	Spectrometry
Alternative label<br>Definition: EmmoClass	SIMS [en]
metaclass<br>Definition: Category (Class), EmmoClass	EmmoClass

Graph

Attachments

Description:

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jsondata

rdf_type

"owl:Class"

uuid

"8d1fa6af-1c40-5566-8605-b90153636112"

iri

"https://w3id.org/emmo/domain/characterisation-methodology/chameo#SecondaryIonMassSpectrometry"

name

"SecondaryIonMassSpectrometry"

label

text	"SecondaryIonMassSpectrometry"
lang	"en"

description

text	"Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions."
lang	"en"

meta

uuid

"a01f538b-3cdf-4e4f-aee9-72168f143e1f"

wiki_page

title	"OSW8d1fa6af1c4055668605b90153636112"
namespace	"Category"

change_id

"4caad4a3-8d2d-4691-8196-627860411931"

type

"Category:OSW57beed5e1294434ba77bb6516e461456"

subclass_of

"Category:OSW12d6c2f4c8785ac1b7ee1f47b1e8dbe4"

metaclass

"Category:OSW57beed5e1294434ba77bb6516e461456"

imported_from

"chameo:SecondaryIonMassSpectrometry"

altLabel

text	"SIMS"
lang	"en"

This category currently contains no pages or media.