Category:OSWe3d0693557b056678535bbbd5420e47f: Difference between revisions

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Latest revision as of 06:04, 1 March 2025

ElectronProbeMicroanalysis
ID	OSWe3d0693557b056678535bbbd5420e47f
UUID	e3d06935-57b0-5667-8535-bbbd5420e47f
Label	ElectronProbeMicroanalysis
Machine compatible name	ElectronProbeMicroanalysis
Statements (outgoing)

Statements (incoming)

Description

Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers.

Category (Class)

OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectronProbeMicroanalysis

EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass	Microscopy
metaclass<br>Definition: Category (Class), EmmoClass	EmmoClass

Graph

Attachments

Description:

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jsondata

rdf_type

"owl:Class"

uuid

"e3d06935-57b0-5667-8535-bbbd5420e47f"

iri

"https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectronProbeMicroanalysis"

name

"ElectronProbeMicroanalysis"

label

text	"ElectronProbeMicroanalysis"
lang	"en"

description

text	"Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers."
lang	"en"