Category:OSW0f1a06a483c8546f966a34af3ee3c7a6
Revision as of 07:55, 25 February 2025
jsondata
| rdf_type | |
|---|
| uuid | "0f1a06a4-83c8-546f-966a-34af3ee3c7a6" |
|---|
| iri | "chameo:ScanningElectronMicroscopy" |
|---|
| name | "ScanningElectronMicroscopy" |
|---|
| label | | text | "ScanningElectronMicroscopy" |
|---|
| lang | "en" |
|---|
|
|
|---|
| description | | text | "The scanning electron microscope (SEM) uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition, and crystalline structure and orientation of materials making up the sample." |
|---|
| lang | "en" |
|---|
|
|
|---|
| meta | | uuid | "387d621e-d3e4-4bf6-b8f3-cd85f4ea86e4" |
|---|
| wiki_page | | title | "OSW0f1a06a483c8546f966a34af3ee3c7a6" |
|---|
| namespace | "Category" |
|---|
|
|---|
| change_id | | "4caad4a3-8d2d-4691-8196-627860411931" |
|
|---|
|
|---|
| type | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
|
|---|
| subclass_of | | "Category:OSW513f071ddc5b536691701e11a1e168fd" |
|
|---|
| metaclass | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
|
|---|
| imported_from | "chameo:ScanningElectronMicroscopy" |
|---|
| altLabel | |
|---|
Subcategories
This category has only the following subcategory.
