Category:OSW9c7eaabba6f251849435e5c671c0f765: Difference between revisions
Category:OSW9c7eaabba6f251849435e5c671c0f765
([bot] update of page content) Tag: Metadata slot edit |
([bot] update of page content) Tag: Metadata slot edit |
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"uuid": "9c7eaabb-a6f2-5184-9435-e5c671c0f765", | "uuid": "9c7eaabb-a6f2-5184-9435-e5c671c0f765", | ||
"iri": "chameo | "iri": "https://w3id.org/emmo/domain/characterisation-methodology/chameo#FieldEmissionScanningElectronMicroscopy", | ||
"name": "FieldEmissionScanningElectronMicroscopy", | "name": "FieldEmissionScanningElectronMicroscopy", | ||
"label": [ | "label": [ | ||
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], | ], | ||
"meta": { | "meta": { | ||
"uuid": " | "uuid": "aeeabd54-5e11-4530-8d5f-55694fb49029", | ||
"wiki_page": { | "wiki_page": { | ||
"title": "OSW9c7eaabba6f251849435e5c671c0f765", | "title": "OSW9c7eaabba6f251849435e5c671c0f765", | ||
Latest revision as of 06:04, 1 March 2025
| FieldEmissionScanningElectronMicroscopy | |
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| ID | OSW9c7eaabba6f251849435e5c671c0f765 |
| UUID | 9c7eaabb-a6f2-5184-9435-e5c671c0f765 |
| Label | FieldEmissionScanningElectronMicroscopy |
| Machine compatible name | FieldEmissionScanningElectronMicroscopy |
| Statements (outgoing) | |
| Statements (incoming) | |
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Description
Field emission scanning electron microscopy (FE-SEM) is an advanced technology used to capture the microstructure image of the materials. FE-SEM is typically performed in a high vacuum because gas molecules tend to disturb the electron beam and the emitted secondary and backscattered electrons used for imaging.
| Category (Class) |
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| OWL Class | |
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| Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class | https://w3id.org/emmo/domain/characterisation-methodology/chameo#FieldEmissionScanningElectronMicroscopy |
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| Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass | |
| Alternative label<br>Definition: EmmoClass |
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| metaclass<br>Definition: Category (Class), EmmoClass |
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jsondata
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| uuid | "9c7eaabb-a6f2-5184-9435-e5c671c0f765" | |||||||||||
| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#FieldEmissionScanningElectronMicroscopy" | |||||||||||
| name | "FieldEmissionScanningElectronMicroscopy" | |||||||||||
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| imported_from | "chameo:FieldEmissionScanningElectronMicroscopy" | |||||||||||
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