Category:OSW91798282061d5db68dc67659bcd7ccea: Difference between revisions

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      ],
      "uuid": "91798282-061d-5db6-8dc6-7659bcd7ccea",
-     "iri": "chameo:ScanningAugerElectronMicroscopy",
+     "iri": "https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningAugerElectronMicroscopy",
      "name": "ScanningAugerElectronMicroscopy",
      "label": [
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      ],
      "meta": {
-         "uuid": "3abc78f0-7a46-4f45-b553-d61d4ff717fa",
+         "uuid": "e64f9624-8946-4943-afd2-b362761477b7",
          "wiki_page": {
              "title": "OSW91798282061d5db68dc67659bcd7ccea",

Latest revision as of 06:05, 1 March 2025

ScanningAugerElectronMicroscopy
ID	OSW91798282061d5db68dc67659bcd7ccea
UUID	91798282-061d-5db6-8dc6-7659bcd7ccea
Label	ScanningAugerElectronMicroscopy
Machine compatible name	ScanningAugerElectronMicroscopy
Statements (outgoing)

Statements (incoming)

Description

Auger electron spectroscopy (AES or simply Auger) is a surface analysis technique that uses an electron beam to excite electrons on atoms in the particle. Atoms that are excited by the electron beam can emit “Auger” electrons. AES measures the kinetic energies of the emitted electrons. The energy of the emitted electrons is characteristic of elements present at the surface and near the surface of a sample.

Category (Class)

OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningAugerElectronMicroscopy

EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass	Microscopy
Alternative label<br>Definition: EmmoClass	AES [en]
metaclass<br>Definition: Category (Class), EmmoClass	EmmoClass

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jsondata

rdf_type

"owl:Class"

uuid

"91798282-061d-5db6-8dc6-7659bcd7ccea"

iri

"https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningAugerElectronMicroscopy"

name

"ScanningAugerElectronMicroscopy"

label

text	"ScanningAugerElectronMicroscopy"
lang	"en"

description

text

"Auger electron spectroscopy (AES or simply Auger) is a surface analysis technique that uses an electron beam to excite electrons on atoms in the particle. Atoms that are excited by the electron beam can emit “Auger” electrons. AES measures the kinetic energies of the emitted electrons. The energy of the emitted electrons is characteristic of elements present at the surface and near the surface of a sample."

lang

"en"