Category:OSW0f1a06a483c8546f966a34af3ee3c7a6: Difference between revisions
Category:OSW0f1a06a483c8546f966a34af3ee3c7a6
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"uuid": "0f1a06a4-83c8-546f-966a-34af3ee3c7a6", | "uuid": "0f1a06a4-83c8-546f-966a-34af3ee3c7a6", | ||
"iri": "chameo | "iri": "https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningElectronMicroscopy", | ||
"name": "ScanningElectronMicroscopy", | "name": "ScanningElectronMicroscopy", | ||
"label": [ | "label": [ | ||
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], | ], | ||
"meta": { | "meta": { | ||
"uuid": " | "uuid": "cf055295-2503-45fa-ac74-439523075f16", | ||
"wiki_page": { | "wiki_page": { | ||
"title": "OSW0f1a06a483c8546f966a34af3ee3c7a6", | "title": "OSW0f1a06a483c8546f966a34af3ee3c7a6", | ||
Latest revision as of 06:05, 1 March 2025
| ScanningElectronMicroscopy | |
|---|---|
| ID | OSW0f1a06a483c8546f966a34af3ee3c7a6 |
| UUID | 0f1a06a4-83c8-546f-966a-34af3ee3c7a6 |
| Label | ScanningElectronMicroscopy |
| Machine compatible name | ScanningElectronMicroscopy |
| Statements (outgoing) | |
| Statements (incoming) | |
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Description
The scanning electron microscope (SEM) uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition, and crystalline structure and orientation of materials making up the sample.
| Category (Class) |
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| OWL Class | |
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| Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class | https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningElectronMicroscopy |
| EmmoClass | |
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| Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass | |
| Alternative label<br>Definition: EmmoClass |
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| metaclass<br>Definition: Category (Class), EmmoClass |
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jsondata
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| uuid | "0f1a06a4-83c8-546f-966a-34af3ee3c7a6" | |||||||||||
| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningElectronMicroscopy" | |||||||||||
| name | "ScanningElectronMicroscopy" | |||||||||||
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| imported_from | "chameo:ScanningElectronMicroscopy" | |||||||||||
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Subcategories
This category has only the following subcategory.
O
- ElectronBackscatterDiffraction (empty)