Category:OSWcc69753cee285bdda798c5699d9c1550: Difference between revisions

VisualWikitext

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      ],
      "uuid": "cc69753c-ee28-5bdd-a798-c5699d9c1550",
-     "iri": "chameo:AtomProbeTomography",
+     "iri": "https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomProbeTomography",
      "name": "AtomProbeTomography",
      "label": [
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      ],
      "meta": {
-         "uuid": "e489a9c1-6127-4756-bef8-96e860de62be",
+         "uuid": "e963c28e-4443-4b3e-96ea-c4797afd181b",
          "wiki_page": {
              "title": "OSWcc69753cee285bdda798c5699d9c1550",
@@ Line 40: / Line 40: @@
      "altLabel": [
          {
-             "text": "3D Atom Probe",
+             "text": "APT",
              "lang": "en"
          },
          {
-             "text": "APT",
+             "text": "3D Atom Probe",
              "lang": "en"
          }
      ]
 }

Revision as of 21:37, 26 February 2025

AtomProbeTomography
ID	OSWcc69753cee285bdda798c5699d9c1550
UUID	cc69753c-ee28-5bdd-a798-c5699d9c1550
Label	AtomProbeTomography
Machine compatible name	AtomProbeTomography
Statements (outgoing)

Statements (incoming)

Description

Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is prepared in the form of a very sharp tip. The cooled tip is biased at high DC voltage (3-15 kV). The very small radius of the tip and the High Voltage induce a very high electrostatic field (tens V/nm) at the tip surface, just below the point of atom evaporation. Under laser or HV pulsing, one or more atoms are evaporated from the surface, by field effect (near 100% ionization), and projected onto a Position Sensitive Detector (PSD) with a very high detection efficiency. Ion efficiencies are as high as 80%, the highest analytical efficiency of any 3D microscopy.

Category (Class)

OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class	https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomProbeTomography

EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass	Tomography
Alternative label<br>Definition: EmmoClass	3D Atom Probe [en] APT [en]
metaclass<br>Definition: Category (Class), EmmoClass	EmmoClass

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jsondata

rdf_type

"owl:Class"

uuid

"cc69753c-ee28-5bdd-a798-c5699d9c1550"

iri

"https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomProbeTomography"

name

"AtomProbeTomography"

label

text	"AtomProbeTomography"
lang	"en"

description

text

"Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is prepared in the form of a very sharp tip. The cooled tip is biased at high DC voltage (3-15 kV). The very small radius of the tip and the High Voltage induce a very high electrostatic field (tens V/nm) at the tip surface, just below the point of atom evaporation. Under laser or HV pulsing, one or more atoms are evaporated from the surface, by field effect (near 100% ionization), and projected onto a Position Sensitive Detector (PSD) with a very high detection efficiency. Ion efficiencies are as high as 80%, the highest analytical efficiency of any 3D microscopy."

lang

"en"