Category:OSWe3d0693557b056678535bbbd5420e47f: Difference between revisions

VisualWikitext

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      ],
      "uuid": "e3d06935-57b0-5667-8535-bbbd5420e47f",
-     "iri": "chameo:ElectronProbeMicroanalysis",
+     "iri": "https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectronProbeMicroanalysis",
      "name": "ElectronProbeMicroanalysis",
      "label": [
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      ],
      "meta": {
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+         "uuid": "dc91ee4e-eac6-4cda-bbd6-91428ddd3851",
          "wiki_page": {
              "title": "OSWe3d0693557b056678535bbbd5420e47f",

Revision as of 21:38, 26 February 2025

ElectronProbeMicroanalysis
ID	OSWe3d0693557b056678535bbbd5420e47f
UUID	e3d06935-57b0-5667-8535-bbbd5420e47f
Label	ElectronProbeMicroanalysis
Machine compatible name	ElectronProbeMicroanalysis
Statements (outgoing)

Statements (incoming)

Description

Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers.

Category (Class)

OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectronProbeMicroanalysis

EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass	Microscopy
metaclass<br>Definition: Category (Class), EmmoClass	EmmoClass

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Attachments

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jsondata

rdf_type

"owl:Class"

uuid

"e3d06935-57b0-5667-8535-bbbd5420e47f"

iri

"https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectronProbeMicroanalysis"

name

"ElectronProbeMicroanalysis"

label

text	"ElectronProbeMicroanalysis"
lang	"en"

description

text	"Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers."
lang	"en"