Property:HasLabel
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| ID | HasLabel |
| UUID | d3a685b2-9fb3-4d04-94e4-4700084f5bec |
| Label | Label |
| Machine compatible name | HasLabel |
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Description
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| name | "HasLabel" | ||||||||||
| property_type | "Monolingual text" | ||||||||||
| uuid | "d3a685b2-9fb3-4d04-94e4-4700084f5bec" | ||||||||||
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F
Force Sensing Resistors (FSRs) (en) +
I
Ion Chromatography (IC) (en) +
E
Energy density calculation (en) +
I
Insulation Resistance Measurement (en) +
S
Sample Analysis (en) +
C
Capacitance measurement (estimation of active area) (en) +
Contact angle measurement (en) +
B
Bending test (defined radii) (en) +
I
Interferometry (en) +
H
Hard case: Laser protocol (sealing) (en) +
L
Laser Doppler Velocimetry (LDV) (en) +
H
Hard case: Speed (sealing) (en) +
C
Coordinate Measurement Machine (CMM) (en) +
E
Electrode placement (lab scale) (en) +
A
Alignment (winding/stacking) (en) +
M
Mandrel Bend Test (en) +
C
Calorimetry (en) +
H
Hard case: Laser power (sealing) (en) +
M
Mass Spectrometry (MS) (en) +
X
X-ray Photoelectron Spectroscopy (XPS) (en) +