AnalyticalElectronMicroscopy

AnalyticalElectronMicroscopy
ID	OSW3e0ebb3c2e00578cb312e0b9c9c8fc7e
UUID	3e0ebb3c-2e00-578c-b312-e0b9c9c8fc7e
Label	AnalyticalElectronMicroscopy
Machine compatible name	AnalyticalElectronMicroscopy
Statements (outgoing)

Statements (incoming)

Description

Analytical electron microscopy (AEM) refers to the collection of spectroscopic data in TEM or STEM, enabling qualitative or quantitative compositional analysis.

Category (Class)

OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class	https://w3id.org/emmo/domain/characterisation-methodology/chameo#AnalyticalElectronMicroscopy

EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass	Microscopy
metaclass<br>Definition: Category (Class), EmmoClass	EmmoClass

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jsondata

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name

"AnalyticalElectronMicroscopy"

label

text	"AnalyticalElectronMicroscopy"
lang	"en"

description

text	"Analytical electron microscopy (AEM) refers to the collection of spectroscopic data in TEM or STEM, enabling qualitative or quantitative compositional analysis."
lang	"en"

meta

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wiki_page

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namespace	"Category"

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metaclass

"Category:OSW57beed5e1294434ba77bb6516e461456"

imported_from

"chameo:AnalyticalElectronMicroscopy"

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