jsondata
| rdf_type | |
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| uuid | "91798282-061d-5db6-8dc6-7659bcd7ccea" |
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| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningAugerElectronMicroscopy" |
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| name | "ScanningAugerElectronMicroscopy" |
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| label | | text | "ScanningAugerElectronMicroscopy" |
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| lang | "en" |
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| description | | text | "Auger electron spectroscopy (AES or simply Auger) is a surface analysis technique that uses an electron beam to excite electrons on atoms in the particle. Atoms that are excited by the electron beam can emit “Auger” electrons. AES measures the kinetic energies of the emitted electrons. The energy of the emitted electrons is characteristic of elements present at the surface and near the surface of a sample." |
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| lang | "en" |
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| meta | | uuid | "93dd1ae1-a88d-4a71-b64d-62bf4a6249a9" |
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| wiki_page | | title | "OSW91798282061d5db68dc67659bcd7ccea" |
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| namespace | "Category" |
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| change_id | | "4caad4a3-8d2d-4691-8196-627860411931" |
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| type | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| subclass_of | | "Category:OSW513f071ddc5b536691701e11a1e168fd" |
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| metaclass | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| imported_from | "chameo:ScanningAugerElectronMicroscopy" |
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