jsondata
| rdf_type | |
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| uuid | "3e0ebb3c-2e00-578c-b312-e0b9c9c8fc7e" |
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| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#AnalyticalElectronMicroscopy" |
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| name | "AnalyticalElectronMicroscopy" |
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| label | | text | "AnalyticalElectronMicroscopy" |
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| lang | "en" |
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| description | | text | "Analytical electron microscopy (AEM) refers to the collection of spectroscopic data in TEM or STEM, enabling qualitative or quantitative compositional analysis." |
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| lang | "en" |
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| meta | | uuid | "d8306929-8650-4b49-8507-dd22a85c3462" |
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| wiki_page | | title | "OSW3e0ebb3c2e00578cb312e0b9c9c8fc7e" |
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| namespace | "Category" |
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| change_id | | "4caad4a3-8d2d-4691-8196-627860411931" |
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| type | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| subclass_of | | "Category:OSW513f071ddc5b536691701e11a1e168fd" |
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| metaclass | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| imported_from | "chameo:AnalyticalElectronMicroscopy" |
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