jsondata
| rdf_type | |
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| uuid | "e3d06935-57b0-5667-8535-bbbd5420e47f" |
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| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectronProbeMicroanalysis" |
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| name | "ElectronProbeMicroanalysis" |
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| label | | text | "ElectronProbeMicroanalysis" |
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| lang | "en" |
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| description | | text | "Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers." |
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| lang | "en" |
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| meta | | uuid | "ae18a2b9-6755-4f83-b957-df62b484aa88" |
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| wiki_page | | title | "OSWe3d0693557b056678535bbbd5420e47f" |
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| namespace | "Category" |
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| change_id | | "4caad4a3-8d2d-4691-8196-627860411931" |
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| type | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| subclass_of | | "Category:OSW513f071ddc5b536691701e11a1e168fd" |
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| metaclass | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| imported_from | "chameo:ElectronProbeMicroanalysis" |
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