ScanningElectronMicroscopy
Category:OSW0f1a06a483c8546f966a34af3ee3c7a6 /
| ScanningElectronMicroscopy | |
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| ID | OSW0f1a06a483c8546f966a34af3ee3c7a6 |
| UUID | 0f1a06a4-83c8-546f-966a-34af3ee3c7a6 |
| Label | ScanningElectronMicroscopy |
| Machine compatible name | ScanningElectronMicroscopy |
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Description
The scanning electron microscope (SEM) uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition, and crystalline structure and orientation of materials making up the sample.
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| OWL Class | |
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| Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class | https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningElectronMicroscopy |
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| Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass | |
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| uuid | "0f1a06a4-83c8-546f-966a-34af3ee3c7a6" | |||||||||||
| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningElectronMicroscopy" | |||||||||||
| name | "ScanningElectronMicroscopy" | |||||||||||
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| imported_from | "chameo:ScanningElectronMicroscopy" | |||||||||||
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Subcategories
This category has only the following subcategory.
O
- ElectronBackscatterDiffraction (empty)