jsondata
| rdf_type | |
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| uuid | "8d1fa6af-1c40-5566-8605-b90153636112" |
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| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#SecondaryIonMassSpectrometry" |
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| name | "SecondaryIonMassSpectrometry" |
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| label | | text | "SecondaryIonMassSpectrometry" |
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| lang | "en" |
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| description | | text | "Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions." |
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| lang | "en" |
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| meta | | uuid | "50937bb3-7380-485d-87df-7f78e7fb3dd0" |
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| wiki_page | | title | "OSW8d1fa6af1c4055668605b90153636112" |
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| namespace | "Category" |
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| change_id | | "4caad4a3-8d2d-4691-8196-627860411931" |
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| type | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| subclass_of | | "Category:OSW12d6c2f4c8785ac1b7ee1f47b1e8dbe4" |
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| metaclass | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| imported_from | "chameo:SecondaryIonMassSpectrometry" |
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| altLabel | |
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