ScanningElectronMicroscopy

ScanningElectronMicroscopy
ID	OSW0f1a06a483c8546f966a34af3ee3c7a6
UUID	0f1a06a4-83c8-546f-966a-34af3ee3c7a6
Label	ScanningElectronMicroscopy
Machine compatible name	ScanningElectronMicroscopy
Statements (outgoing)

Statements (incoming)

Description

The scanning electron microscope (SEM) uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition, and crystalline structure and orientation of materials making up the sample.

Category (Class)

OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningElectronMicroscopy

EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass	Microscopy
Alternative label<br>Definition: EmmoClass	SEM [en]
metaclass<br>Definition: Category (Class), EmmoClass	EmmoClass

Graph

Attachments

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jsondata

rdf_type

"owl:Class"

uuid

"0f1a06a4-83c8-546f-966a-34af3ee3c7a6"

iri

"https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningElectronMicroscopy"

name

"ScanningElectronMicroscopy"

label

text	"ScanningElectronMicroscopy"
lang	"en"

description

text	"The scanning electron microscope (SEM) uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition, and crystalline structure and orientation of materials making up the sample."
lang	"en"

Subcategories

This category has only the following subcategory.

O

ElectronBackscatterDiffraction‎ (empty)