Category:OSWe3d0693557b056678535bbbd5420e47f /
jsondata
| rdf_type | |
|---|
| uuid | "e3d06935-57b0-5667-8535-bbbd5420e47f" |
|---|
| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectronProbeMicroanalysis" |
|---|
| name | "ElectronProbeMicroanalysis" |
|---|
| label | | text | "ElectronProbeMicroanalysis" |
|---|
| lang | "en" |
|---|
|
|
|---|
| description | | text | "Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers." |
|---|
| lang | "en" |
|---|
|
|
|---|
| meta | | uuid | "ae18a2b9-6755-4f83-b957-df62b484aa88" |
|---|
| wiki_page | | title | "OSWe3d0693557b056678535bbbd5420e47f" |
|---|
| namespace | "Category" |
|---|
|
|---|
| change_id | | "4caad4a3-8d2d-4691-8196-627860411931" |
|
|---|
|
|---|
| type | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
|
|---|
| subclass_of | | "Category:OSW513f071ddc5b536691701e11a1e168fd" |
|
|---|
| metaclass | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
|
|---|
| imported_from | "chameo:ElectronProbeMicroanalysis" |
|---|
This category currently contains no pages or media.
