]> 2026-05-17T11:14:36+00:00 AtomProbeTomography 14 en atomprobetomography atomprobetomography

Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is prepared in the form of a very sharp tip. The cooled tip is biased at high DC voltage (3-15 kV). The very small radius of the tip and the High Voltage induce a very high electrostatic field (tens V/nm) at the tip surface, just below the point of atom evaporation. Under laser or HV pulsing, one or more atoms are evaporated from the surface, by field effect (near 100% ionization), and projected onto a Position Sensitive Detector (PSD) with a very high detection efficiency. Ion efficiencies are as high as 80%, the highest analytical efficiency of any 3D microscopy.

AtomProbeTomography

atomprobetomography

Category:OSWcc69753cee285bdda798c5699d9c1550 cc69753c-ee28-5bdd-a798-c5699d9c1550 AtomProbeTomography 2025-03-01T06:03:28Z

2460735.7524074

AtomProbeTomography 14 en AtomProbeTomography#Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth an Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is prepared in the form of a very sharp tip. The cooled tip is biased at high DC voltage (3-15 kV). The very small radius of the tip and the High Voltage induce a very high electrostatic field (tens V/nm) at the tip surface, just below the point of atom evaporation. Under laser or HV pulsing, one or more atoms are evaporated from the surface, by field effect (near 100% ionization), and projected onto a Position Sensitive Detector (PSD) with a very high detection efficiency. Ion efficiencies are as high as 80%, the highest analytical efficiency of any 3D microscopy. 14 en AtomProbeTomography#AtomProbeTomography;en AtomProbeTomography 14 en AtomProbeTomography#atomprobetomography;en atomprobetomography 14 200 1 plainlist 2 [[HasObject::Category:OSWcc69753cee285bdda798c5699d9c1550]] AtomProbeTomography# QUERYc985edbb272d90f5099e729791acfc42 14 0 plainlist 1 [[:Category:OSWcc69753cee285bdda798c5699d9c1550]] AtomProbeTomography# QUERY773f63259ed03bd798c6157fc21b6905 14 [2,"smw-datavalue-import-missing-type","knows","foaf"] AtomProbeTomography# ERRc64006d1114900526065f1730ffd080e 14 en AtomProbeTomography#meta;en meta 14