ScanningElectronMicroscopy
From Battery Knowledge Base
Category:OSW0f1a06a483c8546f966a34af3ee3c7a6
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| uuid | "0f1a06a4-83c8-546f-966a-34af3ee3c7a6" |
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| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningElectronMicroscopy" |
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| name | "ScanningElectronMicroscopy" |
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| label | | text | "ScanningElectronMicroscopy" |
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| lang | "en" |
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| description | | text | "The scanning electron microscope (SEM) uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition, and crystalline structure and orientation of materials making up the sample." |
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| lang | "en" |
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| meta | | uuid | "cf055295-2503-45fa-ac74-439523075f16" |
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| namespace | "Category" |
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| change_id | | "4caad4a3-8d2d-4691-8196-627860411931" |
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| type | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| subclass_of | | "Category:OSW513f071ddc5b536691701e11a1e168fd" |
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| metaclass | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| imported_from | "chameo:ScanningElectronMicroscopy" |
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Subcategories
This category has only the following subcategory.
