Category:OSW9c7eaabba6f251849435e5c671c0f765
jsondata
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| uuid | "9c7eaabb-a6f2-5184-9435-e5c671c0f765" |
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| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#FieldEmissionScanningElectronMicroscopy" |
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| name | "FieldEmissionScanningElectronMicroscopy" |
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| label | | text | "FieldEmissionScanningElectronMicroscopy" |
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| lang | "en" |
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| description | | text | "Field emission scanning electron microscopy (FE-SEM) is an advanced technology used to capture the microstructure image of the materials. FE-SEM is typically performed in a high vacuum because gas molecules tend to disturb the electron beam and the emitted secondary and backscattered electrons used for imaging." |
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| lang | "en" |
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| meta | | uuid | "aeeabd54-5e11-4530-8d5f-55694fb49029" |
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| wiki_page | | title | "OSW9c7eaabba6f251849435e5c671c0f765" |
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| namespace | "Category" |
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| change_id | | "4caad4a3-8d2d-4691-8196-627860411931" |
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| type | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| subclass_of | | "Category:OSW513f071ddc5b536691701e11a1e168fd" |
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| metaclass | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| imported_from | "chameo:FieldEmissionScanningElectronMicroscopy" |
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