Category:OSWaf526a50490151c097f81b8f60dbfb07
jsondata
| rdf_type | |
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| uuid | "af526a50-4901-51c0-97f8-1b8f60dbfb07" |
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| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomicForceMicroscopy" |
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| name | "AtomicForceMicroscopy" |
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| label | | text | "AtomicForceMicroscopy" |
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| lang | "en" |
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| description | | text | "Atomic force microscopy (AFM) is an influential surface analysis technique used for micro/nanostructured coatings. This flexible technique can be used to obtain high-resolution nanoscale images and study local sites in air (conventional AFM) or liquid (electrochemical AFM) surroundings." |
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| lang | "en" |
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| meta | | uuid | "0042fedd-bd41-4520-8510-41b780d05115" |
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| wiki_page | | title | "OSWaf526a50490151c097f81b8f60dbfb07" |
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| namespace | "Category" |
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| change_id | | "4caad4a3-8d2d-4691-8196-627860411931" |
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| type | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| subclass_of | | "Category:OSW513f071ddc5b536691701e11a1e168fd" |
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| metaclass | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| imported_from | "chameo:AtomicForceMicroscopy" |
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