Category:OSW49dd0c540ab35316925b6315128412e4: Difference between revisions

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Latest revision as of 03:57, 3 June 2024

X-ray diffraction (XRD) [OSW49dd0c540ab35316925b6315128412e4]
ID	OSW49dd0c540ab35316925b6315128412e4
UUID	49dd0c54-0ab3-5316-925b-6315128412e4
Label	X-ray diffraction (XRD)
Ontology equivalents

Statements (outgoing)

Statements (incoming)

Keywords

Description

No description found

Category
Supercategories<br>Definition: CategoryClass	AbtractKitMeasurementProcessCategory

MetaKnowledgeBaseCategory

MetaKitMeasurementProcessCategory
kit_id'Technique-ID' column/index in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory	202
measures<br>Definition: MetaKitMeasurementProcessCategory	Microstructure deformation Microstructure deformation (lab scale) Distribution electrolyte
kit_category'KPI / PP' column in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory	Techniques for KPI

Measuring Technique Graph

Graph

Attachments

Description:

📎 Select files (or drop them here)... 📷 Camera

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