Category:OSWaf526a50490151c097f81b8f60dbfb07: Difference between revisions

VisualWikitext

@@ Line 4: / Line 4: @@
      ],
      "uuid": "af526a50-4901-51c0-97f8-1b8f60dbfb07",
-     "iri": "chameo:AtomicForceMicroscopy",
+     "iri": "https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomicForceMicroscopy",
      "name": "AtomicForceMicroscopy",
      "label": [
@@ Line 19: / Line 19: @@
      ],
      "meta": {
-         "uuid": "df14bd1d-1168-4a35-ab51-5fdfa2ab8048",
+         "uuid": "0042fedd-bd41-4520-8510-41b780d05115",
          "wiki_page": {
              "title": "OSWaf526a50490151c097f81b8f60dbfb07",

Latest revision as of 06:03, 1 March 2025

AtomicForceMicroscopy
ID	OSWaf526a50490151c097f81b8f60dbfb07
UUID	af526a50-4901-51c0-97f8-1b8f60dbfb07
Label	AtomicForceMicroscopy
Machine compatible name	AtomicForceMicroscopy
Statements (outgoing)

Statements (incoming)

Description

Atomic force microscopy (AFM) is an influential surface analysis technique used for micro/nanostructured coatings. This flexible technique can be used to obtain high-resolution nanoscale images and study local sites in air (conventional AFM) or liquid (electrochemical AFM) surroundings.

Category (Class)

OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class	https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomicForceMicroscopy

EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass	Microscopy
metaclass<br>Definition: Category (Class), EmmoClass	EmmoClass

Graph

Attachments

Description:

📎 Select files (or drop them here)... 📷 Camera

jsondata

rdf_type

"owl:Class"

uuid

"af526a50-4901-51c0-97f8-1b8f60dbfb07"

iri

"https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomicForceMicroscopy"

name

"AtomicForceMicroscopy"

label

text	"AtomicForceMicroscopy"
lang	"en"

description

text	"Atomic force microscopy (AFM) is an influential surface analysis technique used for micro/nanostructured coatings. This flexible technique can be used to obtain high-resolution nanoscale images and study local sites in air (conventional AFM) or liquid (electrochemical AFM) surroundings."
lang	"en"

meta

uuid

"0042fedd-bd41-4520-8510-41b780d05115"

wiki_page

title	"OSWaf526a50490151c097f81b8f60dbfb07"
namespace	"Category"

change_id

"4caad4a3-8d2d-4691-8196-627860411931"

type

"Category:OSW57beed5e1294434ba77bb6516e461456"

subclass_of

"Category:OSW513f071ddc5b536691701e11a1e168fd"

metaclass

"Category:OSW57beed5e1294434ba77bb6516e461456"

imported_from

"chameo:AtomicForceMicroscopy"

This category currently contains no pages or media.