Category:OSWd4538e0bb26b5f3b8365fef0ccaac34c: Difference between revisions

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Latest revision as of 06:04, 1 March 2025

EnvironmentalScanningElectronMicroscopy
ID	OSWd4538e0bb26b5f3b8365fef0ccaac34c
UUID	d4538e0b-b26b-5f3b-8365-fef0ccaac34c
Label	EnvironmentalScanningElectronMicroscopy
Machine compatible name	EnvironmentalScanningElectronMicroscopy
Statements (outgoing)

Statements (incoming)

Description

The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber.

Category (Class)

OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class	https://w3id.org/emmo/domain/characterisation-methodology/chameo#EnvironmentalScanningElectronMicroscopy

EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass	Microscopy
metaclass<br>Definition: Category (Class), EmmoClass	EmmoClass

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jsondata

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name

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label

text	"EnvironmentalScanningElectronMicroscopy"
lang	"en"

description

text	"The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber."
lang	"en"

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imported_from

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