Category:OSW9c7eaabba6f251849435e5c671c0f765: Difference between revisions

VisualWikitext

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      ],
      "uuid": "9c7eaabb-a6f2-5184-9435-e5c671c0f765",
-     "iri": "chameo:FieldEmissionScanningElectronMicroscopy",
+     "iri": "https://w3id.org/emmo/domain/characterisation-methodology/chameo#FieldEmissionScanningElectronMicroscopy",
      "name": "FieldEmissionScanningElectronMicroscopy",
      "label": [
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      ],
      "meta": {
-         "uuid": "2478e937-ec75-4301-88d7-0516d42d7c56",
+         "uuid": "aeeabd54-5e11-4530-8d5f-55694fb49029",
          "wiki_page": {
              "title": "OSW9c7eaabba6f251849435e5c671c0f765",

Latest revision as of 06:04, 1 March 2025

FieldEmissionScanningElectronMicroscopy
ID	OSW9c7eaabba6f251849435e5c671c0f765
UUID	9c7eaabb-a6f2-5184-9435-e5c671c0f765
Label	FieldEmissionScanningElectronMicroscopy
Machine compatible name	FieldEmissionScanningElectronMicroscopy
Statements (outgoing)

Statements (incoming)

Description

Field emission scanning electron microscopy (FE-SEM) is an advanced technology used to capture the microstructure image of the materials. FE-SEM is typically performed in a high vacuum because gas molecules tend to disturb the electron beam and the emitted secondary and backscattered electrons used for imaging.

Category (Class)

OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class	https://w3id.org/emmo/domain/characterisation-methodology/chameo#FieldEmissionScanningElectronMicroscopy

EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass	Microscopy
Alternative label<br>Definition: EmmoClass	FE-SEM [en]
metaclass<br>Definition: Category (Class), EmmoClass	EmmoClass

Graph

Attachments

Description:

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jsondata

rdf_type

"owl:Class"

uuid

"9c7eaabb-a6f2-5184-9435-e5c671c0f765"

iri

"https://w3id.org/emmo/domain/characterisation-methodology/chameo#FieldEmissionScanningElectronMicroscopy"

name

"FieldEmissionScanningElectronMicroscopy"

label

text	"FieldEmissionScanningElectronMicroscopy"
lang	"en"

description

text	"Field emission scanning electron microscopy (FE-SEM) is an advanced technology used to capture the microstructure image of the materials. FE-SEM is typically performed in a high vacuum because gas molecules tend to disturb the electron beam and the emitted secondary and backscattered electrons used for imaging."
lang	"en"

meta

uuid

"aeeabd54-5e11-4530-8d5f-55694fb49029"

wiki_page

title	"OSW9c7eaabba6f251849435e5c671c0f765"
namespace	"Category"

change_id

"4caad4a3-8d2d-4691-8196-627860411931"

type

"Category:OSW57beed5e1294434ba77bb6516e461456"

subclass_of

"Category:OSW513f071ddc5b536691701e11a1e168fd"

metaclass

"Category:OSW57beed5e1294434ba77bb6516e461456"

imported_from

"chameo:FieldEmissionScanningElectronMicroscopy"

altLabel

text	"FE-SEM"
lang	"en"

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