Category:OSW7345e43a2d365e39b6496762fa951d94: Difference between revisions

VisualWikitext

@@ Line 4: / Line 4: @@
      ],
      "uuid": "7345e43a-2d36-5e39-b649-6762fa951d94",
-     "iri": "chameo:ScanningKelvinProbe",
+     "iri": "https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningKelvinProbe",
      "name": "ScanningKelvinProbe",
      "label": [
@@ Line 19: / Line 19: @@
      ],
      "meta": {
-         "uuid": "395dfc68-9aad-4dbc-b5af-7a53f4945632",
+         "uuid": "1037f7ca-ef5a-47f1-842b-6e1d9706c65b",
          "wiki_page": {
              "title": "OSW7345e43a2d365e39b6496762fa951d94",

Latest revision as of 06:05, 1 March 2025

ScanningKelvinProbe
ID	OSW7345e43a2d365e39b6496762fa951d94
UUID	7345e43a-2d36-5e39-b649-6762fa951d94
Label	ScanningKelvinProbe
Machine compatible name	ScanningKelvinProbe
Statements (outgoing)

Statements (incoming)

Description

Scanning Kelvin probe (SKP) and scanning Kelvin probe force microscopy (SKPFM) are probe techniques which permit mapping of topography and Volta potential distribution on electrode surfaces. It measures the surface electrical potential of a sample without requiring an actual physical contact.

Category (Class)

OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningKelvinProbe

EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass	Microscopy
Alternative label<br>Definition: EmmoClass	SKB [en]
metaclass<br>Definition: Category (Class), EmmoClass	EmmoClass

Graph

Attachments

Description:

📎 Select files (or drop them here)... 📷 Camera

jsondata

rdf_type

"owl:Class"

uuid

"7345e43a-2d36-5e39-b649-6762fa951d94"

iri

"https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningKelvinProbe"

name

"ScanningKelvinProbe"

label

text	"ScanningKelvinProbe"
lang	"en"

description

text	"Scanning Kelvin probe (SKP) and scanning Kelvin probe force microscopy (SKPFM) are probe techniques which permit mapping of topography and Volta potential distribution on electrode surfaces. It measures the surface electrical potential of a sample without requiring an actual physical contact."
lang	"en"

meta

uuid

"1037f7ca-ef5a-47f1-842b-6e1d9706c65b"

wiki_page

title	"OSW7345e43a2d365e39b6496762fa951d94"
namespace	"Category"

change_id

"4caad4a3-8d2d-4691-8196-627860411931"

type

"Category:OSW57beed5e1294434ba77bb6516e461456"

subclass_of

"Category:OSW513f071ddc5b536691701e11a1e168fd"

metaclass

"Category:OSW57beed5e1294434ba77bb6516e461456"

imported_from

"chameo:ScanningKelvinProbe"

altLabel

text	"SKB"
lang	"en"

This category currently contains no pages or media.