Category:OSW7345e43a2d365e39b6496762fa951d94
jsondata
| rdf_type | |
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| uuid | "7345e43a-2d36-5e39-b649-6762fa951d94" |
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| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningKelvinProbe" |
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| name | "ScanningKelvinProbe" |
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| label | | text | "ScanningKelvinProbe" |
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| lang | "en" |
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| description | | text | "Scanning Kelvin probe (SKP) and scanning Kelvin probe force microscopy (SKPFM) are probe techniques which permit mapping of topography and Volta potential distribution on electrode surfaces. It measures the surface electrical potential of a sample without requiring an actual physical contact." |
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| lang | "en" |
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| meta | | uuid | "1037f7ca-ef5a-47f1-842b-6e1d9706c65b" |
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| wiki_page | | title | "OSW7345e43a2d365e39b6496762fa951d94" |
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| namespace | "Category" |
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| change_id | | "4caad4a3-8d2d-4691-8196-627860411931" |
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| type | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| subclass_of | | "Category:OSW513f071ddc5b536691701e11a1e168fd" |
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| metaclass | | "Category:OSW57beed5e1294434ba77bb6516e461456" |
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| imported_from | "chameo:ScanningKelvinProbe" |
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