Category:OSWaf526a50490151c097f81b8f60dbfb07: Difference between revisions

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AtomicForceMicroscopy
ID OSWaf526a50490151c097f81b8f60dbfb07
UUID af526a50-4901-51c0-97f8-1b8f60dbfb07
Label AtomicForceMicroscopy
Machine compatible name AtomicForceMicroscopy
Statements (outgoing)
Statements (incoming)

Description


๐Ÿ“Ž Select files (or drop them here)... ๐Ÿ“ท Camera
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    iri"chameo:AtomicForceMicroscopy"
    name"AtomicForceMicroscopy"
    label
    text"AtomicForceMicroscopy"
    lang"en"
    description
    text"Atomic force microscopy (AFM) is an influential surface analysis technique used for micro/nanostructured coatings. This flexible technique can be used to obtain high-resolution nanoscale images and study local sites in air (conventional AFM) or liquid (electrochemical AFM) surroundings."
    lang"en"
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    namespace"Category"
    change_id
    "4caad4a3-8d2d-4691-8196-627860411931"
    type
    "Category:OSW57beed5e1294434ba77bb6516e461456"
    subclass_of
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    metaclass
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    imported_from"chameo:AtomicForceMicroscopy"

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