Category:OSWaf526a50490151c097f81b8f60dbfb07: Difference between revisions
Category:OSWaf526a50490151c097f81b8f60dbfb07
([bot] update of page content) Tag: Metadata slot edit |
([bot] update of page content) Tag: Metadata slot edit |
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"uuid": "af526a50-4901-51c0-97f8-1b8f60dbfb07", | "uuid": "af526a50-4901-51c0-97f8-1b8f60dbfb07", | ||
"iri": "chameo | "iri": "https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomicForceMicroscopy", | ||
"name": "AtomicForceMicroscopy", | "name": "AtomicForceMicroscopy", | ||
"label": [ | "label": [ | ||
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], | ], | ||
"meta": { | "meta": { | ||
"uuid": " | "uuid": "0042fedd-bd41-4520-8510-41b780d05115", | ||
"wiki_page": { | "wiki_page": { | ||
"title": "OSWaf526a50490151c097f81b8f60dbfb07", | "title": "OSWaf526a50490151c097f81b8f60dbfb07", | ||
Latest revision as of 06:03, 1 March 2025
| AtomicForceMicroscopy | |
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| ID | OSWaf526a50490151c097f81b8f60dbfb07 |
| UUID | af526a50-4901-51c0-97f8-1b8f60dbfb07 |
| Label | AtomicForceMicroscopy |
| Machine compatible name | AtomicForceMicroscopy |
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| Statements (incoming) | |
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Description
Atomic force microscopy (AFM) is an influential surface analysis technique used for micro/nanostructured coatings. This flexible technique can be used to obtain high-resolution nanoscale images and study local sites in air (conventional AFM) or liquid (electrochemical AFM) surroundings.
| Category (Class) |
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| OWL Class | |
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| Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class | https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomicForceMicroscopy |
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| Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass | |
| metaclass<br>Definition: Category (Class), EmmoClass |
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| uuid | "af526a50-4901-51c0-97f8-1b8f60dbfb07" | |||||||||||
| iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomicForceMicroscopy" | |||||||||||
| name | "AtomicForceMicroscopy" | |||||||||||
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| imported_from | "chameo:AtomicForceMicroscopy" |
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