Category:OSW1088265eb1a55a1d9adf61857e1e2e74: Difference between revisions

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Latest revision as of 06:06, 1 March 2025

TransmissionElectronMicroscopy
ID	OSW1088265eb1a55a1d9adf61857e1e2e74
UUID	1088265e-b1a5-5a1d-9adf-61857e1e2e74
Label	TransmissionElectronMicroscopy
Machine compatible name	TransmissionElectronMicroscopy
Statements (outgoing)

Statements (incoming)

Description

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Category (Class)

OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class	https://w3id.org/emmo/domain/characterisation-methodology/chameo#TransmissionElectronMicroscopy

EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass	Microscopy
Alternative label<br>Definition: EmmoClass	TEM [en]
metaclass<br>Definition: Category (Class), EmmoClass	EmmoClass

Graph

Attachments

Description:

📎 Select files (or drop them here)... 📷 Camera

jsondata

rdf_type

"owl:Class"

uuid

"1088265e-b1a5-5a1d-9adf-61857e1e2e74"

iri

"https://w3id.org/emmo/domain/characterisation-methodology/chameo#TransmissionElectronMicroscopy"

name

"TransmissionElectronMicroscopy"

label

text	"TransmissionElectronMicroscopy"
lang	"en"

description

text

"Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device."

lang

"en"