Category:OSW1088265eb1a55a1d9adf61857e1e2e74
jsondata
rdf_type | |
---|
uuid | "1088265e-b1a5-5a1d-9adf-61857e1e2e74" |
---|
iri | "https://w3id.org/emmo/domain/characterisation-methodology/chameo#TransmissionElectronMicroscopy" |
---|
name | "TransmissionElectronMicroscopy" |
---|
label | text | "TransmissionElectronMicroscopy" |
---|
lang | "en" |
---|
|
|
---|
description | text | "Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device." |
---|
lang | "en" |
---|
|
|
---|
meta | uuid | "c7823dab-bd89-403b-bfbc-508fb340fe98" |
---|
wiki_page | title | "OSW1088265eb1a55a1d9adf61857e1e2e74" |
---|
namespace | "Category" |
---|
|
---|
change_id | "4caad4a3-8d2d-4691-8196-627860411931" |
|
---|
|
---|
type | "Category:OSW57beed5e1294434ba77bb6516e461456" |
|
---|
subclass_of | "Category:OSW513f071ddc5b536691701e11a1e168fd" |
|
---|
metaclass | "Category:OSW57beed5e1294434ba77bb6516e461456" |
|
---|
imported_from | "chameo:TransmissionElectronMicroscopy" |
---|
altLabel | |
---|
This category currently contains no pages or media.