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==== Purpose and Advantages of Half-Cell Measurements ==== | ==== Purpose and Advantages of Half-Cell Measurements ==== | ||
Half-cell configurations allow the measurement of the open-circuit potential (OCP) of a single electrode without interference from the counter electrode. This is particularly important for model development, where accurate OCP–stoichiometry relationships are needed for each electrode independently. | Half-cell configurations allow the measurement of the open-circuit potential (OCP) of a single electrode without interference from the counter electrode. This is particularly important for model development, where accurate OCP–stoichiometry relationships are needed for each electrode independently. Full-cell measurements only provide access to the combined potential difference between two electrodes. This makes it mathematically impossible to resolve individual OCP curves without assumptions or external references—a limitation known as the "observability problem." Half-cell testing avoids this issue by providing direct access to the electrode under study. | ||
Full-cell measurements only provide access to the combined potential difference between two electrodes. This makes it mathematically impossible to resolve individual OCP curves without | |||
This methodology supports model calibration, validation of new materials, and analysis of degradation mechanisms, and is applicable across a wide range of chemistries and formats. | This methodology supports model calibration, validation of new materials, and analysis of degradation mechanisms, and is applicable across a wide range of chemistries and formats. |
Revision as of 09:02, 3 April 2025
PseudoOpenCircuitVoltageMethod | |
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Label | PseudoOpenCircuitVoltageMethod |
Machine compatible name | PseudoOpenCircuitVoltageMethod |
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Description
A technique used to measure the voltage of a cell under a low applied current as an estimate for the open-circuit voltage.
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Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class | https://w3id.org/emmo/domain/characterisation-methodology/chameo#PseudoOpenCircuitVoltageMethod |
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The pseudo-open-circuit voltage (pseudo-OCV) method is a practical approach for estimating the open-circuit potential (OCP) of intercalation electrodes, such as those in lithium-ion batteries. It enables the derivation of OCP versus stoichiometry functions from low-rate galvanostatic tests and is especially useful in the context of parameterizing physics-based battery models. This article outlines the method’s basis, implementation in half and full cells, and best practices for test protocols and data processing.
Background
In lithium-ion batteries, the open-circuit voltage (OCV) at the cell level is the difference between the OCPs of the positive and negative electrodes. The half-cell OCP function is a key parameter for physics-based battery models, such as the Doyle–Fuller–Newman (DFN) model, and critical for accurate state estimation and degradation modelling.
Traditional methods to extract OCP include:
- GITT (Galvanostatic Intermittent Titration Technique): accurate but time-consuming
- Three-electrode-cell measurements: invasive and susceptible to artifacts
- Relaxation-based methods: slow and affected by hysteresis
The pseudo-OCV method approximates near-equilibrium voltages using slow constant-current cycling (typically C/30 or slower).
Overview of the Method
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