Atomic Force Microscopy (AFM)

Category:OSW28616df390f8528c8ec40357233f5eff /
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Atomic Force Microscopy (AFM) [OSW28616df390f8528c8ec40357233f5eff]
ID OSW28616df390f8528c8ec40357233f5eff
UUID 28616df3-90f8-528c-8ec4-0357233f5eff
Label Atomic Force Microscopy (AFM)
Ontology equivalents
Statements (outgoing)
Statements (incoming)
Keywords

Description

No description found
Category
Supercategories<br>Definition: CategoryClass
MetaKnowledgeBaseCategory
Ontology IRI(s)e. g. from the EMMO, BattINFO, BVCO or DataBatt ontology<br>Definition: MetaKnowledgeBaseCategory
  • https://w3id.org/emmo/domain/chameo#AtomicForceMicroscopy
  • MetaKitMeasurementProcessCategory
    measures<br>Definition: MetaKitMeasurementProcessCategory
  • Surface roughness
  • kit_id'Technique-ID' column/index in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory 10
    kit_category'KPI / PP' column in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory Techniques for KPI
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