Layer thickness homogeneity (dry film)

Category:OSW32e7407f314a5df5a56f0d7defa9a4a2
Layer thickness homogeneity (dry film) [OSW32e7407f314a5df5a56f0d7defa9a4a2]
ID OSW32e7407f314a5df5a56f0d7defa9a4a2
UUID 32e7407f-314a-5df5-a56f-0d7defa9a4a2
Label Layer thickness homogeneity (dry film)
Ontology equivalents
Statements (outgoing)
Statements (incoming)
Keywords

Description

No description found
Category
Supercategories<br>Definition: CategoryClass
MetaKnowledgeBaseCategory
MetaKitCharacteristicCategory
kit_commentColumn 'Comments' in the KIT excel sheet<br>Definition: MetaKitCharacteristic Other measurement technique: X-ray Reflectivity (XRR)
kit_unitsColumn 'Unit' in the KIT excel sheet, spit by ',' and ';'<br>Definition: MetaKitCharacteristic
  • (+/-) µm
kit_typeColumn 'Process Parameter PP / Material Property M' in the KIT excel sheet<br>Definition: MetaKitCharacteristic M
kit_categoryColumn 'Category' in the KIT excel sheet<br>Definition: MetaKitCharacteristic physical
jsondata
uuid"32e7407f-314a-5df5-a56f-0d7defa9a4a2"
label
text"Layer thickness homogeneity (dry film)"
lang"en"
type
"Category:OSWc15b622daa514022a801849c6593cbdf"
subclass_of
"Category:OSWf50ba030bbb743b196e1739fb67d6862"
kit_units
"(+/-) µm"
kit_type"M"
kit_comment"Other measurement technique: X-ray Reflectivity (XRR)"
kit_category"physical"
jsonschema
@context
"/wiki/Category:OSWf50ba030bbb743b196e1739fb67d6862?action=raw&slot=jsonschema"
allOf
$ref"/wiki/Category:OSWf50ba030bbb743b196e1739fb67d6862?action=raw&slot=jsonschema"
type"object"
uuid"32e7407f-314a-5df5-a56f-0d7defa9a4a2"
title""
title*
en"Layer thickness homogeneity (dry film)"
description""
description*
Empty object
required
"type"
properties
type
default
"Category:OSW32e7407f314a5df5a56f0d7defa9a4a2"

This category currently contains no pages or media.