Category:OSW32e7407f314a5df5a56f0d7defa9a4a2: Difference between revisions

855 bytes added , 3 June

[bot] update of page content

@@ Line 12: / Line 12: @@
      "subclass_of": [
          "Category:OSWf50ba030bbb743b196e1739fb67d6862"
-     ]
+     ],
+    "kit_units": [
+        "(+/-) µm"
+    ],
+    "kit_type": "M",
+    "kit_comment": "Other measurement technique: X-ray Reflectivity (XRR)",
+    "kit_category": "physical"
 }
@@ Line 1: / Line 1: @@
-{}
+{
+    "@context": [
+        "/wiki/Category:OSWf50ba030bbb743b196e1739fb67d6862?action=raw\u0026slot=jsonschema"
+    ],
+    "allOf": [
+        {
+            "$ref": "/wiki/Category:OSWf50ba030bbb743b196e1739fb67d6862?action=raw\u0026slot=jsonschema"
+        }
+    ],
+    "type": "object",
+    "uuid": "32e7407f-314a-5df5-a56f-0d7defa9a4a2",
+    "title": "",
+    "title*": {
+        "en": "Layer thickness homogeneity (dry film)"
+    },
+    "description": "",
+    "description*": {},
+    "required": [
+        "type"
+    ],
+    "properties": {
+        "type": {
+            "default": [
+                "Category:OSW32e7407f314a5df5a56f0d7defa9a4a2"
+            ]
+        }
+    }
+}

1,209

edits

Category:OSW32e7407f314a5df5a56f0d7defa9a4a2 (view source)