Property:Text
"Text" is a predefined property that represents text of arbitrary length and is provided by Semantic MediaWiki. This property is pre-deployed (also known as special property) and comes with additional administrative privileges but can be used just like any other user-defined property.
E
energy difference between an electron at rest at infinity and an electron at the lowest level of the conduction band in an insulator or semiconductor +
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Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In this configuration, the SEM incident beam hits the tilted sample. As backscattered electrons leave the sample, they interact with the crystal's periodic atomic lattice planes and diffract according to Bragg's law at various scattering angles before reaching the phosphor screen forming Kikuchi patterns (EBSPs). EBSD spatial resolution depends on many factors, including the nature of the material under study and the sample preparation. Thus, EBSPs can be indexed to provide information about the material's grain structure, grain orientation, and phase at the micro-scale. EBSD is applied for impurities and defect studies, plastic deformation, and statistical analysis for average misorientation, grain size, and crystallographic texture. EBSD can also be combined with energy-dispersive X-ray spectroscopy (EDS), cathodoluminescence (CL), and wavelength-dispersive X-ray spectroscopy (WDS) for advanced phase identification and materials discovery. +
ElectronBackscatterDiffraction +
electronbackscatterdiffraction +
ElectronCharge +
The negative of ElementaryCharge. +
electroncharge +
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ElectronDensity +
Number of electrons in conduction band per volume. +
electrondensity +
meta +
restrictions +
ElectronMass +
electronmass +
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Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers. +
ElectronProbeMicroanalysis +