Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) [OSW28616df390f8528c8ec40357233f5eff]
ID	OSW28616df390f8528c8ec40357233f5eff
UUID	28616df3-90f8-528c-8ec4-0357233f5eff
Label	Atomic Force Microscopy (AFM)
Ontology equivalents

Statements (outgoing)

Statements (incoming)

Keywords

Description

No description found

Category
Supercategories<br>Definition: CategoryClass	AbtractKitMeasurementProcessCategory

MetaKnowledgeBaseCategory
Ontology IRI(s)e. g. from the EMMO, BattINFO, BVCO or DataBatt ontology<br>Definition: MetaKnowledgeBaseCategory	https://w3id.org/emmo/domain/chameo#AtomicForceMicroscopy

MetaKitMeasurementProcessCategory
measures<br>Definition: MetaKitMeasurementProcessCategory	Surface roughness
kit_id'Technique-ID' column/index in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory	10
kit_category'KPI / PP' column in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory	Techniques for KPI

Measuring Technique Graph

Graph

Attachments

Description:

📎 Select files (or drop them here)... 📷 Camera

jsondata

uuid

"28616df3-90f8-528c-8ec4-0357233f5eff"

label

text	"Atomic Force Microscopy (AFM)"
lang	"en"

type

"Category:OSW5f6f1e51583f472a8fb7426536315174"

subclass_of

"Category:OSW3684c31643ea491b90ea885db9ae864e"

ontology_iri

"https://w3id.org/emmo/domain/chameo#AtomicForceMicroscopy"

kit_id

10

kit_category

"Techniques for KPI"

measures

"Category:OSW5f5ff5a509005c2e854611d230884dde"

jsonschema

@context

"/wiki/Category:OSW3684c31643ea491b90ea885db9ae864e?action=raw&slot=jsonschema"

allOf

$ref	"/wiki/Category:OSW3684c31643ea491b90ea885db9ae864e?action=raw&slot=jsonschema"

type

"object"

uuid

"28616df3-90f8-528c-8ec4-0357233f5eff"

title

""

title*

en	"Atomic Force Microscopy (AFM)"

description

""

description*

Empty object

required

"type"

properties

type

default

"Category:OSW28616df390f8528c8ec40357233f5eff"

This category currently contains no pages or media.