Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM)
ID	OSW9471f4a030dc5efd8ccd93085ff17846
UUID	9471f4a0-30dc-5efd-8ccd-93085ff17846
Label	Scanning Electron Microscopy (SEM)
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Category (Class)
Supercategories<br>Definition: Category (Class)	Measurement Process

Meta Knowledge Base Category

Measurement Process Type
ID'Technique-ID' column/index in the KIT excel sheet<br>Definition: Measurement Process Type	160
Measures<br>Definition: Measurement Process Type	Surface morphology (charge collectors) Particle size distribution (active materials) Particle size distribution (binder) Particle shape (active material) Surface quality (electrode film wet) Binder distribution Composition Conductive additive distribution Density dry electrode Fractures in dry electrode Layer thickness dry electrode Layer thickness homogeneity (dry film) Pore size distribution (dry film) Porosity dry electrode Density calendered electrode Fractures in calendered electrode Layer thickness calendered electrode Layer thickness homogeneity (calendered electrode film) Pore size distribution (calendered film) Porosity calendered electrode Surface roughness Edge quality Geometry of cut edges Metallic foreign particles Microstructure deformation Edge quality (lab scale) Geometry of cut edges (lab scale) Metallic foreign particles (lab scale) Microstructure deformation (lab scale) Foreign particle concentration Welding technique
Category'KPI / PP' column in the KIT excel sheet<br>Definition: Measurement Process Type	Techniques for KPI

Measuring Technique Graph

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jsondata

uuid

"9471f4a0-30dc-5efd-8ccd-93085ff17846"

label

text	"Scanning Electron Microscopy (SEM)"
lang	"en"

type

"Category:OSW5f6f1e51583f472a8fb7426536315174"

subclass_of

"Category:OSW3684c31643ea491b90ea885db9ae864e"

kit_id

160

kit_category

"Techniques for KPI"

measures

"Category:OSWdaaa0be3458653c597775d0daf929146"

"Category:OSW84a0a96459b356f8b4eb9152e4896395"

"Category:OSWa526e2b88e565286a8e901492717d654"

"Category:OSW28aa797fd2fd52748ecc5d14a89ffe8d"

"Category:OSW3121ff7230435a6b956b1a8e9ec27dc9"

"Category:OSW617f45f0c38e58b893414a2810e6bebf"

"Category:OSW592673133f545d9f8c6a73972dede165"

"Category:OSW0d30199fb1cf53428133e16af8bf584d"

"Category:OSWa1835d14703253c9b382a0d08c7efb5d"

"Category:OSW761e7ea781875d8f9876b38ea969e79f"

"Category:OSW71ed6bc7dae85dbd8e8a6a7e2c48de70"

"Category:OSW32e7407f314a5df5a56f0d7defa9a4a2"

"Category:OSW38944c6578b35906b11b3a2614728e16"

"Category:OSW9137e1c8304958418b8254c1f83f4835"

"Category:OSW0861645af1655f018e3e5cd468fd03e5"

"Category:OSWac17600f55405bec9d33ef8c4aac8213"

"Category:OSW9c9e99ef0c115f69888cc4bbd9a349a3"

"Category:OSWbcb86434ff7f5d82b97cd717a27d24ea"

"Category:OSWbf89e2e2d21c5014992aea5fa4e6f316"

"Category:OSWfeeb8d244bb557d18b1212b518f9fe0f"

"Category:OSW5f5ff5a509005c2e854611d230884dde"

"Category:OSW235591b01d6855c39dcd8ee32ccc6d66"

"Category:OSWc52fa2165ae952eb82925f1de570600a"

"Category:OSW123009203e025242badc6f0653d5c73b"

"Category:OSWa0fc9313333c5fbba40432c1db8870c4"

"Category:OSWec4bda7f436c5632863887c267797969"

"Category:OSW61e3946256195c5ea6ee7dc00eef09be"

"Category:OSWad2607fad0b15654a2a6b43c333ec93d"

"Category:OSW720f2c7ac73b57d6aa93e3344590be48"

"Category:OSWeb9b5cbb88245d07bda38c331d924f63"

"Category:OSWc2b380f44a5956739faf606cd7249272"

jsonschema

@context

"/wiki/Category:OSW3684c31643ea491b90ea885db9ae864e?action=raw&slot=jsonschema"

allOf

$ref	"/wiki/Category:OSW3684c31643ea491b90ea885db9ae864e?action=raw&slot=jsonschema"

type

"object"

uuid

"9471f4a0-30dc-5efd-8ccd-93085ff17846"

title

""

title*

en	"Scanning Electron Microscopy (SEM)"

description

""

description*

Empty object

required

"type"

properties

type

default

"Category:OSW9471f4a030dc5efd8ccd93085ff17846"

This category currently contains no pages or media.