FieldEmissionScanningElectronMicroscopy

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Category:OSW9c7eaabba6f251849435e5c671c0f765
FieldEmissionScanningElectronMicroscopy
ID OSW9c7eaabba6f251849435e5c671c0f765
UUID 9c7eaabb-a6f2-5184-9435-e5c671c0f765
Label FieldEmissionScanningElectronMicroscopy
Machine compatible name FieldEmissionScanningElectronMicroscopy
Statements (outgoing)
Statements (incoming)

Description

Field emission scanning electron microscopy (FE-SEM) is an advanced technology used to capture the microstructure image of the materials. FE-SEM is typically performed in a high vacuum because gas molecules tend to disturb the electron beam and the emitted secondary and backscattered electrons used for imaging.

Category (Class)
OWL Class
Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class https://w3id.org/emmo/domain/characterisation-methodology/chameo#FieldEmissionScanningElectronMicroscopy
EmmoClass
Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass
Alternative label<br>Definition: EmmoClass
  • FE-SEM [en]
    • metaclass<br>Definition: Category (Class), EmmoClass
  • EmmoClass
    • jsondata
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    iri"https://w3id.org/emmo/domain/characterisation-methodology/chameo#FieldEmissionScanningElectronMicroscopy"
    name"FieldEmissionScanningElectronMicroscopy"
    label
    text"FieldEmissionScanningElectronMicroscopy"
    lang"en"
    description
    text"Field emission scanning electron microscopy (FE-SEM) is an advanced technology used to capture the microstructure image of the materials. FE-SEM is typically performed in a high vacuum because gas molecules tend to disturb the electron beam and the emitted secondary and backscattered electrons used for imaging."
    lang"en"
    meta
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    wiki_page
    title"OSW9c7eaabba6f251849435e5c671c0f765"
    namespace"Category"
    change_id
    "4caad4a3-8d2d-4691-8196-627860411931"
    type
    "Category:OSW57beed5e1294434ba77bb6516e461456"
    subclass_of
    "Category:OSW513f071ddc5b536691701e11a1e168fd"
    metaclass
    "Category:OSW57beed5e1294434ba77bb6516e461456"
    imported_from"chameo:FieldEmissionScanningElectronMicroscopy"
    altLabel
    text"FE-SEM"
    lang"en"

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