MediaWiki:Smw import chameo
https://w3id.org/emmo/domain/characterisation-methodology/chameo# | Characterisation Methodology Ontology
hasAccessConditions|Type:Page hasBPMNDiagram|Type:Page hasBeginCharacterisationTask|Type:Page hasCharacterisationComponent|Type:Page hasCharacterisationEnvironment|Type:Page hasCharacterisationEnvironmentProperty|Type:Page hasCharacterisationInput|Type:Page hasCharacterisationMeasurementInstrument|Type:Page hasCharacterisationOutput|Type:Page hasCharacterisationProcedureValidation|Type:Page hasCharacterisationProperty|Type:Page hasCharacterisationSoftware|Type:Page hasCharacterisationTask|Type:Page hasDataAcquisitionRate|Type:Page hasDataProcessingThroughCalibration|Type:Page hasDataQuality|Type:Page hasDataset|Type:Page hasEndCharacterisationTask|Type:Page hasHardwareSpecification|Type:Page hasHazard|Type:Page hasHolder|Type:Page hasInstrumentForCalibration|Type:Page hasInteractionVolume|Type:Page hasInteractionWithProbe|Type:Page hasInteractionWithSample|Type:Page hasLab|Type:Page hasLevelOfAutomation|Type:Page hasManufacturer|Type:Text hasMeasurementDetector|Type:Page hasMeasurementParameter|Type:Page hasMeasurementProbe|Type:Page hasMeasurementSample|Type:Page hasMeasurementTime|Type:Page hasModel|Type:Text hasOperator|Type:Page hasPeerReviewedArticle|Type:Page hasPhysicsOfInteraction|Type:Page hasPostProcessingModel|Type:Page hasProcessingReproducibility|Type:Page hasReferenceSample|Type:Page hasSampleForInspection|Type:Page hasSampleForPreparation|Type:Page hasSampleInspectionInstrument|Type:Page hasSampleInspectionParameter|Type:Page hasSamplePreparationInstrument|Type:Page hasSamplePreparationParameter|Type:Page hasSampledSample|Type:Page hasUniqueID|Type:Text rationaleHasCharacterisationProcedure|Type:Page rationaleHasUserCase|Type:Page requiresLevelOfExpertise|Type:Page ACVoltammetry|Category AbrasiveStrippingVoltammetry|Category AccessConditions|Category AdsorptiveStrippingVoltammetry|Category AlphaSpectrometry|Category Amperometry|Category AnalyticalElectronMicroscopy|Category AnodicStrippingVoltammetry|Category AtomProbeTomography|Category AtomicForceMicroscopy|Category BPMNDiagram|Category BrunauerEmmettTellerMethod|Category CalibrationData|Category CalibrationProcess|Category Calorimetry|Category CathodicStrippingVoltammetry|Category CharacterisationComponent|Category CharacterisationData|Category CharacterisationDataValidation|Category CharacterisationEnvironment|Category CharacterisationEnvironmentProperty|Category CharacterisationExperiment|Category CharacterisationHardware|Category CharacterisationHardwareManufacturer|Category CharacterisationHardwareModel|Category CharacterisationHardwareSpecification|Category CharacterisationMeasurementInstrument|Category CharacterisationMeasurementProcess|Category CharacterisationProcedure|Category CharacterisationProcedureValidation|Category CharacterisationProperty|Category CharacterisationProtocol|Category CharacterisationSoftware|Category CharacterisationSystem|Category CharacterisationTask|Category CharacterisationTechnique|Category CharacterisationWorkflow|Category CharacterisedSample|Category ChargeDistribution|Category Chromatography|Category Chronoamperometry|Category Chronocoulometry|Category Chronopotentiometry|Category CompressionTesting|Category ConductometricTitration|Category Conductometry|Category ConfocalMicroscopy|Category CoulometricTitration|Category Coulometry|Category CreepTesting|Category CriticalAndSupercriticalChromatography|Category CyclicChronopotentiometry|Category CyclicVoltammetry|Category DCPolarography|Category DataAcquisitionRate|Category DataAnalysis|Category DataFiltering|Category DataNormalisation|Category DataPostProcessing|Category DataPreparation|Category DataQuality|Category Detector|Category DeviceSample|Category DielectricAndImpedanceSpectroscopy|Category Dielectrometry|Category DifferentialLinearPulseVoltammetry|Category DifferentialPulseVoltammetry|Category DifferentialRefractiveIndex|Category DifferentialScanningCalorimetry|Category DifferentialStaircasePulseVoltammetry|Category DifferentialThermalAnalysis|Category Dilatometry|Category DirectCoulometryAtControlledCurrent|Category DirectCoulometryAtControlledPotential|Category DirectCurrentInternalResistance|Category DynamicLightScattering|Category DynamicMechanicalAnalysis|Category DynamicMechanicalSpectroscopy|Category Electrochemical|Category ElectrochemicalImpedanceSpectroscopy|Category ElectrochemicalPiezoelectricMicrogravimetry|Category ElectrochemicalTesting|Category Electrogravimetry|Category ElectronBackscatterDiffraction|Category ElectronProbeMicroanalysis|Category Ellipsometry|Category EnergyDispersiveXraySpectroscopy|Category EnvironmentalScanningElectronMicroscopy|Category Exafs|Category FatigueTesting|Category FibDic|Category FieldEmissionScanningElectronMicroscopy|Category FourierTransformInfraredSpectroscopy|Category Fractography|Category FreezingPointDepressionOsmometry|Category GalvanostaticIntermittentTitrationTechnique|Category GammaSpectrometry|Category GasAdsorptionPorosimetry|Category Grinding|Category HPPC|Category HardnessTesting|Category Hazard|Category Holder|Category HydrodynamicVoltammetry|Category ICI|Category Impedimetry|Category InteractionVolume|Category IntermediateSample|Category IonChromatography|Category IonMobilitySpectrometry|Category IsothermalMicrocalorimetry|Category Laboratory|Category LevelOfAutomation|Category LevelOfExpertise|Category LightScattering|Category LinearChronopotentiometry|Category LinearScanVoltammetry|Category MassSpectrometry|Category MeasurementDataPostProcessing|Category MeasurementParameter|Category MeasurementSystemAdjustment|Category MeasurementTime|Category MechanicalTesting|Category MembraneOsmometry|Category MercuryPorosimetry|Category Microscopy|Category Milling|Category Mounting|Category Nanoindentation|Category NeutronSpinEchoSpectroscopy|Category Nexafs|Category NormalPulseVoltammetry|Category NuclearMagneticResonance|Category OpenCircuitHold|Category Operator|Category OpticalMicroscopy|Category OpticalTesting|Category Osmometry|Category OutlierRemoval|Category PhotoluminescenceMicroscopy|Category Polishing|Category Porosimetry|Category PostProcessingModel|Category PotentiometricStrippingAnalysis|Category Potentiometry|Category PreparedSample|Category PrimaryData|Category Probe|Category ProbeSampleInteraction|Category Profilometry|Category PseudoOpenCircuitVoltageMethod|Category PulsedElectroacousticMethod|Category RamanSpectroscopy|Category Rationale|Category RawData|Category RawSample|Category ReferenceSample|Category Sample|Category SampleExtraction|Category SampleExtractionByCutting|Category SampleExtractionInstrument|Category SampleInspection|Category SampleInspectionInstrument|Category SampleInspectionParameter|Category SamplePreparation|Category SamplePreparationByCutting|Category SamplePreparationInstrument|Category SamplePreparationParameter|Category SampledDCPolarography|Category ScanningAugerElectronMicroscopy|Category ScanningElectronMicroscopy|Category ScanningKelvinProbe|Category ScanningProbeMicroscopy|Category ScanningTunnelingMicroscopy|Category ScatteringAndDiffraction|Category SecondaryData|Category SecondaryIonMassSpectrometry|Category ShearOrTorsionTesting|Category Signal|Category Spectrometry|Category Spectroscopy|Category SquareWaveVoltammetry|Category StepChronopotentiometry|Category StrippingVoltammetry|Category Synchrotron|Category TensileTesting|Category ThermochemicalTesting|Category Thermogravimetry|Category ThreePointBendingTesting|Category Tomography|Category TransmissionElectronMicroscopy|Category UltrasonicTesting|Category UltravioletVisibleSpectroscopy|Category UserCase|Category VaporPressureDepressionOsmometry|Category Viscometry|Category Voltammetry|Category VoltammetryAtARotatingDiskElectrode|Category WearTesting|Category XpsVariableKinetic|Category XrayDiffraction|Category XrayPowderDiffraction|Category XrdGrazingIncidence|Category