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From Battery Knowledge Base
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- ElectronBackscatterDiffraction + (Electron backscatter diffraction (EBSD) is … Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In this configuration, the SEM incident beam hits the tilted sample. As backscattered electrons leave the sample, they interact with the crystal's periodic atomic lattice planes and diffract according to Bragg's law at various scattering angles before reaching the phosphor screen forming Kikuchi patterns (EBSPs). EBSD spatial resolution depends on many factors, including the nature of the material under study and the sample preparation. Thus, EBSPs can be indexed to provide information about the material's grain structure, grain orientation, and phase at the micro-scale. EBSD is applied for impurities and defect studies, plastic deformation, and statistical analysis for average misorientation, grain size, and crystallographic texture. EBSD can also be combined with energy-dispersive X-ray spectroscopy (EDS), cathodoluminescence (CL), and wavelength-dispersive X-ray spectroscopy (WDS) for advanced phase identification and materials discovery.se identification and materials discovery.)
- ElectronProbeMicroanalysis + (Electron probe microanalysis (EPMA) is use … Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers. wavelength-dispersive (WD) spectrometers.)
- ElectronAffinity + (ElectronAffinity)
- ElectronBackscatterDiffraction + (ElectronBackscatterDiffraction)
- ElectronCharge + (ElectronCharge)
- ElectronDensity + (ElectronDensity)
- ElectronMass + (ElectronMass)
- ElectronProbeMicroanalysis + (ElectronProbeMicroanalysis)
- ElectronRadius + (ElectronRadius)
- ElectronVolt + (ElectronVolt)
- ComputerSystem + (Electronic device capable of processing data, typically in binary form, according to instructions given to it in a variable program.)
- ElectronicConductivity + (ElectronicConductivity)
- ElectronicModel + (ElectronicModel)
- Electroosmosis + (Electroosmosis)
- Electroplating + (Electroplating)
- Electroplating + (Electroplating)
- Elemental Analysis + (Elemental Analysis)
- ElementalMaterial + (ElementalMaterial)
- ElementalSubstance + (ElementalSubstance)
- Elementary Multiperspective Material Ontology + (Elementary Multiperspective Material Ontology)
- Elementary Multiperspective Material Ontology (EMMO) + (Elementary Multiperspective Material Ontology (EMMO))
- Elementary Multiperspective Material Ontology (EMMO) + (Elementary Multiperspective Material Ontol … Elementary Multiperspective Material Ontology (EMMO)</br></br>EMMO is a multidisciplinary effort to develop a standard representational framework (the ontology) based on current materials modelling knowledge, including physical sciences, analytical philosophy and information and communication technologies.</br></br>It provides the connection between the physical world, materials characterisation world and materials modelling world.</br></br>EMMO is released under a Creative Commons license Attribution 4.0 International (CC BY 4.0).Attribution 4.0 International (CC BY 4.0).)
- ElementaryBoson + (ElementaryBoson)
- ElementaryCharge + (ElementaryCharge)
- ElementaryElectron + (ElementaryElectron)
- ElementaryFermion + (ElementaryFermion)
- ElementaryParticle + (ElementaryParticle)
- ElementaryPhoton + (ElementaryPhoton)
- ElementaryQuark + (ElementaryQuark)
- ElevenEs + (ElevenEs)
- Elinor Batteries + (Elinor Batteries)
- Elinor Batteries + (ElinorBatteries)
- Elixabete Ayerbe + (Elixabete Ayerbe)
- Elkem AS + (Elkem)
- Elkem AS + (Elkem AS)
- Ellipsometry + (Ellipsometry)
- Ellipsometry + (Ellipsometry is an optical technique that … Ellipsometry is an optical technique that uses polarised light to probe the dielectric properties of a sample (optical system). The common application of ellipsometry is the analysis of thin films. Through the analysis of the state of polarisation of the light that is reflected from the sample, ellipsometry yields information on the layers that are thinner than the wavelength of the light itself, down to a single atomic layer or less. Depending on what is already known about the sample, the technique can probe a range of properties including layer thickness, morphology, and chemical composition.ess, morphology, and chemical composition.)
- ElringKlinger + (ElringKlinger)
- EmanueleGhedini + (EmanueleGhedini)
- EmergencyBattery + (EmergencyBattery)
- Emma Argutyan + (Emma Argutyan)
- EmmoClass + (EmmoClass)
- Empa - Swiss Federal Laboratories for Materials Science and Technology + (Empa - Swiss Federal Laboratories for Materials Science and Technology)
- Empa - Swiss Federal Laboratories for Materials Science and Technology + (Empa is the interdisciplinary materials science institute of the ETH Domain conducting cutting-edge materials and technology research.)
- EmpiricalFormula + (EmpiricalFormula)
- EmpiricalSimulationSoftware + (EmpiricalSimulationSoftware)
- Emulsion + (Emulsion)
- Enabling battery quality at scale + (Enabling battery quality at scale)
- Dataset + (Encoded data made of more than one datum.)
- Encoder systems (rotary encoder/linear encoder) + (Encoder systems (rotary encoder/linear encoder))
- End of charge voltage + (End of charge voltage)
