Category:OSW9471f4a030dc5efd8ccd93085ff17846: Difference between revisions

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Scanning Electron Microscopy (SEM) [OSW9471f4a030dc5efd8ccd93085ff17846]
ID	OSW9471f4a030dc5efd8ccd93085ff17846
UUID	9471f4a0-30dc-5efd-8ccd-93085ff17846
Label	Scanning Electron Microscopy (SEM)
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Category
Supercategories<br>Definition: CategoryClass	AbtractKitMeasurementProcessCategory

MetaKnowledgeBaseCategory

MetaKitMeasurementProcessCategory
kit_id'Technique-ID' column/index in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory	160
measures<br>Definition: MetaKitMeasurementProcessCategory	Surface morphology (charge collectors) Particle size distribution (active materials) Particle size distribution (binder) Particle shape (active material) Surface quality (electrode film wet) Binder distribution Composition Conductive additive distribution Density dry electrode Fractures in dry electrode Layer thickness dry electrode Layer thickness homogeneity (dry film) Pore size distribution (dry film) Porosity dry electrode Density calendered electrode Fractures in calendered electrode Layer thickness calendered electrode Layer thickness homogeneity (calendered electrode film) Pore size distribution (calendered film) Porosity calendered electrode Surface roughness Edge quality Geometry of cut edges Metallic foreign particles Microstructure deformation Edge quality (lab scale) Geometry of cut edges (lab scale) Metallic foreign particles (lab scale) Microstructure deformation (lab scale) Foreign particle concentration Welding technique
kit_category'KPI / PP' column in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory	Techniques for KPI

Measuring Technique Graph

Graph

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jsondata

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label

text	"Scanning Electron Microscopy (SEM)"
lang	"en"

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