Category:OSW28616df390f8528c8ec40357233f5eff: Difference between revisions

VisualWikitext

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      "measures": [
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      ]
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Latest revision as of 03:57, 3 June 2024

Atomic Force Microscopy (AFM) [OSW28616df390f8528c8ec40357233f5eff]
ID	OSW28616df390f8528c8ec40357233f5eff
UUID	28616df3-90f8-528c-8ec4-0357233f5eff
Label	Atomic Force Microscopy (AFM)
Ontology equivalents

Statements (outgoing)

Statements (incoming)

Keywords

Description

No description found

Category
Supercategories<br>Definition: CategoryClass	AbtractKitMeasurementProcessCategory

MetaKnowledgeBaseCategory
Ontology IRI(s)e. g. from the EMMO, BattINFO, BVCO or DataBatt ontology<br>Definition: MetaKnowledgeBaseCategory	https://w3id.org/emmo/domain/chameo#AtomicForceMicroscopy

MetaKitMeasurementProcessCategory
measures<br>Definition: MetaKitMeasurementProcessCategory	Surface roughness
kit_id'Technique-ID' column/index in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory	10
kit_category'KPI / PP' column in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory	Techniques for KPI

Measuring Technique Graph

Graph

Attachments

Description:

📎 Select files (or drop them here)... 📷 Camera

jsondata

uuid

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ontology_iri

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kit_id

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kit_category

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measures

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title*

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description

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description*

Empty object

required

"type"

properties

type

default

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