| Layer thickness homogeneity (dry film) [OSW32e7407f314a5df5a56f0d7defa9a4a2] | |
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| ID | OSW32e7407f314a5df5a56f0d7defa9a4a2 |
| UUID | 32e7407f-314a-5df5-a56f-0d7defa9a4a2 |
| Label | Layer thickness homogeneity (dry film) |
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| MetaKitCharacteristicCategory | |
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| kit_commentColumn 'Comments' in the KIT excel sheet<br>Definition: MetaKitCharacteristic | Other measurement technique: X-ray Reflectivity (XRR) |
| kit_unitsColumn 'Unit' in the KIT excel sheet, spit by ',' and ';'<br>Definition: MetaKitCharacteristic |
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| kit_typeColumn 'Process Parameter PP / Material Property M' in the KIT excel sheet<br>Definition: MetaKitCharacteristic | M |
| kit_categoryColumn 'Category' in the KIT excel sheet<br>Definition: MetaKitCharacteristic | physical |
Graph Characteristic Graph
| uuid | "32e7407f-314a-5df5-a56f-0d7defa9a4a2" | |||||
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