| Atomic Force Microscopy (AFM) | |
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| ID | OSW28616df390f8528c8ec40357233f5eff |
| UUID | 28616df3-90f8-528c-8ec4-0357233f5eff |
| Label | Atomic Force Microscopy (AFM) |
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No description found
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| Supercategories<br>Definition: Category (Class) | |
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| ontology_irie. g. from the EMMO, BattINFO, BVCO or DataBatt ontology<br>Definition: Meta Knowledge Base Category |
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| Measurement Process Type | |
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| Measures<br>Definition: Measurement Process Type |
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| ID'Technique-ID' column/index in the KIT excel sheet<br>Definition: Measurement Process Type | 10 |
| Category'KPI / PP' column in the KIT excel sheet<br>Definition: Measurement Process Type | Techniques for KPI |
Graph Measuring Technique Graph
| uuid | "28616df3-90f8-528c-8ec4-0357233f5eff" | |||||
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