Atomic Force Microscopy (AFM)

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Category:OSW28616df390f8528c8ec40357233f5eff /
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Atomic Force Microscopy (AFM) [OSW28616df390f8528c8ec40357233f5eff]
ID OSW28616df390f8528c8ec40357233f5eff
UUID 28616df3-90f8-528c-8ec4-0357233f5eff
Label Atomic Force Microscopy (AFM)
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    jsondata
    uuid"28616df3-90f8-528c-8ec4-0357233f5eff"
    label
    text"Atomic Force Microscopy (AFM)"
    lang"en"
    type
    "Category:OSW5f6f1e51583f472a8fb7426536315174"
    subclass_of
    "Category:OSW3684c31643ea491b90ea885db9ae864e"
    measures
    "Category:OSW5f5ff5a509005c2e854611d230884dde"

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