Atomic Force Microscopy (AFM)
Category:OSW28616df390f8528c8ec40357233f5eff /
| Atomic Force Microscopy (AFM) [OSW28616df390f8528c8ec40357233f5eff] | |
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| ID | OSW28616df390f8528c8ec40357233f5eff |
| UUID | 28616df3-90f8-528c-8ec4-0357233f5eff |
| Label | Atomic Force Microscopy (AFM) |
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Description
No description found
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| measures<br>Definition: MetaKitMeasurementProcessCategory |
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| kit_id'Technique-ID' column/index in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory | 10 |
| kit_category'KPI / PP' column in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory | Techniques for KPI |
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