Layer thickness homogeneity (dry film)

Layer thickness homogeneity (dry film) [OSW32e7407f314a5df5a56f0d7defa9a4a2]
ID	OSW32e7407f314a5df5a56f0d7defa9a4a2
UUID	32e7407f-314a-5df5-a56f-0d7defa9a4a2
Label	Layer thickness homogeneity (dry film)
Ontology equivalents

Statements (outgoing)

Statements (incoming)

Keywords

Description

No description found

Category
Supercategories<br>Definition: CategoryClass	AbstractKitCharacteristicCategory

MetaKnowledgeBaseCategory

MetaKitCharacteristicCategory
kit_commentColumn 'Comments' in the KIT excel sheet<br>Definition: MetaKitCharacteristic	Other measurement technique: X-ray Reflectivity (XRR)
kit_unitsColumn 'Unit' in the KIT excel sheet, spit by ',' and ';'<br>Definition: MetaKitCharacteristic	(+/-) µm
kit_typeColumn 'Process Parameter PP / Material Property M' in the KIT excel sheet<br>Definition: MetaKitCharacteristic	M
kit_categoryColumn 'Category' in the KIT excel sheet<br>Definition: MetaKitCharacteristic	physical

Characteristic Graph

Graph

Attachments

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jsondata

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subclass_of

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kit_units

"(+/-) µm"

kit_type

"M"

kit_comment

"Other measurement technique: X-ray Reflectivity (XRR)"

kit_category

"physical"

jsonschema

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title

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title*

en	"Layer thickness homogeneity (dry film)"

description

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Empty object

required

"type"

properties

type

default

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