Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) [OSW28616df390f8528c8ec40357233f5eff]
ID	OSW28616df390f8528c8ec40357233f5eff
UUID	28616df3-90f8-528c-8ec4-0357233f5eff
Label	Atomic Force Microscopy (AFM)
Ontology equivalents

Statements (outgoing)

Statements (incoming)

Keywords

Description

No description found

Category
Supercategories<br>Definition: CategoryClass	AbtractKitMeasurementProcessCategory

MetaKnowledgeBaseCategory
Ontology IRI(s)e. g. from the EMMO, BattINFO, BVCO or DataBatt ontology<br>Definition: MetaKnowledgeBaseCategory	https://w3id.org/emmo/domain/chameo#AtomicForceMicroscopy

MetaKitMeasurementProcessCategory
measures<br>Definition: MetaKitMeasurementProcessCategory	Surface roughness
kit_id'Technique-ID' column/index in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory	10
kit_category'KPI / PP' column in the KIT excel sheet<br>Definition: MetaKitMeasurementProcessCategory	Techniques for KPI

Description:

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jsondata

uuid

"28616df3-90f8-528c-8ec4-0357233f5eff"

label

text	"Atomic Force Microscopy (AFM)"
lang	"en"

type

"Category:OSW5f6f1e51583f472a8fb7426536315174"

subclass_of

"Category:OSW3684c31643ea491b90ea885db9ae864e"

measures

"Category:OSW5f5ff5a509005c2e854611d230884dde"

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