Search by property

This page provides a simple browsing interface for finding entities described by a property and a named value. Other available search interfaces include the page property search, and the ask query builder.

List of results

• TelluriumAtom  + (Atom subclass for tellurium.)
• TennessineAtom  + (Atom subclass for tennessine.)
• TerbiumAtom  + (Atom subclass for terbium.)
• ThalliumAtom  + (Atom subclass for thallium.)
• ThoriumAtom  + (Atom subclass for thorium.)
• ThuliumAtom  + (Atom subclass for thulium.)
• TinAtom  + (Atom subclass for tin.)
• TitaniumAtom  + (Atom subclass for titanium.)
• TungstenAtom  + (Atom subclass for tungsten.)
• UraniumAtom  + (Atom subclass for uranium.)
• VanadiumAtom  + (Atom subclass for vanadium.)
• XenonAtom  + (Atom subclass for xenon.)
• YtterbiumAtom  + (Atom subclass for ytterbium.)
• YttriumAtom  + (Atom subclass for yttrium.)
• ZincAtom  + (Atom subclass for zinc.)
• ZirconiumAtom  + (Atom subclass for zirconium.)
• AtomProbeTomography  + (AtomProbeTomography)
• Atomic Force Microscopy (AFM)  + (Atomic Force Microscopy (AFM))
• AtomicForceMicroscopy  + (Atomic force microscopy (AFM) is an influe … Atomic force microscopy (AFM) is an influential surface analysis technique used for micro/nanostructured coatings. This flexible technique can be used to obtain high-resolution nanoscale images and study local sites in air (conventional AFM) or liquid (electrochemical AFM) surroundings.liquid (electrochemical AFM) surroundings.)
• PrincipalQuantumNumber  + (Atomic quantum number related to the number n−1 of radial nodes of one-electron wave functions.)
• OrbitalAngularMomentumQuantumNumber  + (Atomic quantum number related to the orbital angular momentum l of a one-electron state.)
• MagneticQuantumNumber  + (Atomic quantum number related to the z component lz, jz or sz, of the orbital, total, or spin angular momentum.)
• AtomicAndNuclearPhysicsQuantity  + (AtomicAndNuclearPhysicsQuantity)
• AtomicAttenuationCoefficient  + (AtomicAttenuationCoefficient)
• AtomicForceMicroscopy  + (AtomicForceMicroscopy)

• AtomicMass  + (AtomicMass)

• AtomicNumber  + (AtomicNumber)
• AtomicPhysicsCrossSection  + (AtomicPhysicsCrossSection)
• AtomicScatteringFactor  + (AtomicScatteringFactor)
• AtomisticModel  + (AtomisticModel)
• Attenuation  + (Attenuation)
• Atto  + (Atto)
• AttoCoulomb  + (AttoCoulomb)
• AttoFarad  + (AttoFarad)
• AttoJoule  + (AttoJoule)
• AttoJouleSecond  + (AttoJouleSecond)
• AttoPrefixedUnit  + (AttoPrefixedUnit)
• Property  + (Attribut)
• Quantity Property  + (Attribut das eine physikalische Größe repräsentiert)
• HasNormalizedLabel  + (Attribut, das HasLabel in Kleinbuchstaben speichert, wobei alle nicht alphanumerischen Zeichen entfernt werden, um eine normalisierte Suche zu ermöglichen)
• Auditory  + (Auditory)
• Task  + (Aufgabe)
• Task Status  + (Aufgabenstatus)
• Discontinued  + (Aufgegeben)
• Enumeration  + (Aufzählung)
• Status Enumeration  + (Aufzählung von Zustandsbeschreibungen)
• ScanningAugerElectronMicroscopy  + (Auger electron spectroscopy (AES or simply … Auger electron spectroscopy (AES or simply Auger) is a surface analysis technique that uses an electron beam to excite electrons on atoms in the particle. Atoms that are excited by the electron beam can emit “Auger” electrons. AES measures the kinetic energies of the emitted electrons. The energy of the emitted electrons is characteristic of elements present at the surface and near the surface of a sample. surface and near the surface of a sample.)
• August Johansson  + (August Johansson)
• Austrian Institute of Technology  + (Austrian Institute of Technology)
• Autoclave  + (Autoclave)
• Car  + (Automobil)