Search by property

This page provides a simple browsing interface for finding entities described by a property and a named value. Other available search interfaces include the page property search, and the ask query builder.

List of results

• Electrode slurry  + (Electrode slurry)
• Electrode wettability  + (Electrode wettability)
• Electrode wettability  + (Electrode wettability (kinetics of wetting process))
• ReferenceElectrode  + (Electrode with a well-defined and constant equilibrium potential with respect to which it is possible to measure or calculate electrode potentials of other electrodes by including them in an appropriate electrochemical cell.)
• ElectrodeCoating  + (ElectrodeCoating)
• ElectrodeCoverageDensity  + (ElectrodeCoverageDensity)
• ElectrodeElectrolyteInterface  + (ElectrodeElectrolyteInterface)
• ElectrodeGeometricSurfaceArea  + (ElectrodeGeometricSurfaceArea)
• ElectrodePair  + (ElectrodePair)
• ElectrodePassivation  + (ElectrodePassivation)
• ElectrodePolarisation  + (ElectrodePolarisation)
• ElectrodePotential  + (ElectrodePotential)
• ElectrodeReaction  + (ElectrodeReaction)
• ElectrodeRealSurfaceArea  + (ElectrodeRealSurfaceArea)
• ElectrodeStack  + (ElectrodeStack)
• ElectrodeSurfaceArea  + (ElectrodeSurfaceArea)
• Electrodeposition  + (Electrodeposition)
• Electrodissolution  + (Electrodissolution)
• Electrogravimetry  + (Electrogravimetry)
• ElectrochemicalPiezoelectricMicrogravimetry  + (Electrogravimetry using an electrochemical … Electrogravimetry using an electrochemical quartz crystal microbalance. The change of mass is, for rigid deposits, linearly proportional to the change of the reso- nance frequency of the quartz crystal, according to the Sauerbrey equation. For non- rigid deposits, corrections must be made. rigid deposits, corrections must be made.)
• Electrolysis  + (Electrolysis)
• Electrolyte  + (Electrolyte)
• Electrolyte filling  + (Electrolyte filling)
• Electrolyte volume  + (Electrolyte volume)
• ElectrolyteAdditive  + (ElectrolyteAdditive)

• ElectrolyteContainment  + (ElectrolyteContainment)

• ElectrolyteCreep  + (ElectrolyteCreep)
• ElectrolyteLevelIndicator  + (ElectrolyteLevelIndicator)
• ElectrolyteSolution  + (ElectrolyteSolution)
• Electrolytes  + (Electrolytes)
• ElectrolyticCapacitor  + (ElectrolyticCapacitor)
• ElectrolyticCell  + (ElectrolyticCell)
• ElectrolyticConductivity  + (ElectrolyticConductivity)
• ElectrolyticConductivityData  + (ElectrolyticConductivityData)
• ElectrolyticDeposition  + (ElectrolyticDeposition)
• ElectromagneticEnergyDensity  + (ElectromagneticEnergyDensity)
• ElectromagneticQuantity  + (ElectromagneticQuantity)
• Electron Spectroscopy for Chemical Analysis (ESCA)  + (Electron Spectroscopy for Chemical Analysis (ESCA))
• ElectronBackscatterDiffraction  + (Electron backscatter diffraction (EBSD) is … Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In this configuration, the SEM incident beam hits the tilted sample. As backscattered electrons leave the sample, they interact with the crystal's periodic atomic lattice planes and diffract according to Bragg's law at various scattering angles before reaching the phosphor screen forming Kikuchi patterns (EBSPs). EBSD spatial resolution depends on many factors, including the nature of the material under study and the sample preparation. Thus, EBSPs can be indexed to provide information about the material's grain structure, grain orientation, and phase at the micro-scale. EBSD is applied for impurities and defect studies, plastic deformation, and statistical analysis for average misorientation, grain size, and crystallographic texture. EBSD can also be combined with energy-dispersive X-ray spectroscopy (EDS), cathodoluminescence (CL), and wavelength-dispersive X-ray spectroscopy (WDS) for advanced phase identification and materials discovery.se identification and materials discovery.)
• ElectronProbeMicroanalysis  + (Electron probe microanalysis (EPMA) is use … Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers. wavelength-dispersive (WD) spectrometers.)
• ElectronAffinity  + (ElectronAffinity)
• ElectronBackscatterDiffraction  + (ElectronBackscatterDiffraction)
• ElectronCharge  + (ElectronCharge)
• ElectronDensity  + (ElectronDensity)
• ElectronMass  + (ElectronMass)
• ElectronProbeMicroanalysis  + (ElectronProbeMicroanalysis)
• ElectronRadius  + (ElectronRadius)
• ElectronVolt  + (ElectronVolt)
• ComputerSystem  + (Electronic device capable of processing data, typically in binary form, according to instructions given to it in a variable program.)
• ElectronicConductivity  + (ElectronicConductivity)
• ElectronicModel  + (ElectronicModel)